Abstract

In-plane misorientations of laser deposited YBCO films on MgO substrates were investigated by means of X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). The YBCO crystals preferentially rotated by 45° in addition to the epitaxial orientation were frequently observed, and the volume fraction of the misoriented grains increase as the growth temperature increased. From the AFM observation on the MgO substrate, the r110r ledges were observed for the substrate on which 45° misorientation of YBCO occurred preferentially. The bridge made from the misoriented YBCO film, in which a 45° grain boundary (GB) exclusively existed, showed a clear AC Josephson effect with the RSJ type I–V characteristics at 4.2K. The GB weak link was discussed in relation to the oxygen deficiency at the GB.

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