Abstract
Field ion microscopy of pyrolytic graphite produced image streaks resulting from gross surface irregularities as a result of the etching characteristics in tip preparation. The streaks were observed to contract with a decrease in imaging voltage and to remain relatively stable. Commercial high-modulus graphite fibers could be electropolished to fine tips, and single image points (occurring as double spots) were observed for the first time in the field ion microscope. These image points were interpreted to represent the carbon atoms in the corner of a single graphite platelet. It is concluded from these experiments that the possibility of studying graphite by field-ion microscopy might be viewed with a little more optimism.
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