Abstract

A combined field ion (FIM) and scanning tunneling microscope (STM), which we call “FI-STM,” was designed and constructed with multiple surface analytical functions. The system is equipped with a LEED/AES system and a sputtering gun and/or heating devices for preparing and characterizing specimen surfaces. The field ion microscope (FIM) is operated at room temperature to observe the geometry of the STM scanning tip in-situ in the course of STM investigations. The instrument has been operated successfully by observing the structures of the graphite (0001), the Si (111) 7×7 and the Si (100) 2×1 surfaces.

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