Abstract
Field emission properties of randomly distributed copper nanowires are presented. The wires were potentiostatically deposited into the pores of polycarbonate membranes produced by the ion-track etch technique. The diameter and length of the vertically aligned wires with number densities between 106 and 108wires/cm2 were in the range of 210–330nm and 8–18μm, respectively. By means of field emission scanning microscopy, emission site densities between 0.4×105cm−2 and 1.4×105cm−2 were obtained for nA currents at 6V/μm. Two-thirds of the nanowire emitters showed Fowler–Nordheim behaviour with an average field enhancement factor of β=245, which is about three times higher than expected for a cylindrical wire geometry with a half-sphere tip.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
