Abstract
Employing our energy-focused atom-probe FIM, providing high resolution and freedom from artifacts, we have obtained complete crystallographic distribution of helium and neon field adsorbed on W, Mo, Ta, Rh, Ir, Pt, and Re. In addition we have determined the abundance of metal–helium and metal–neon molecular ions of these metals as obtained by field evaporation. The dependence of the relative abundance of metal–helium molecule ions upon the substrate temperature and the crystallographic surface area is established. Whereas the triply charged W, Ta, Mo, and Re helides and doubly charged helides of other metals are predominant molecular ion species in pulsed field evaporation, metal–neïdes are formed with a probability of less than 10−3. We were unable to confirm with our precise instrument a high probability of IrHe+++ and IrNe++ as indirectly deduced by Panitz. We are convinced that the high abundance of IrNe++ and IrNe+++ reported by Waugh from observations with a time-gated imaging field desorption microscope must also be artifacts.
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