Abstract
Preferential evaporation and retention of elements during pulsed field evaporation of a specimen is known to affect the results of a chemical analysis in the atom probe field ion microscope. Field evaporation produced by increasing the standing voltage on the specimen alters the surface chemistry because the more easily field evaporated elements will be removed preferentially. This change in surface chemistry will result in incorrect compositions being measured for small precipitates, boundaries or surfaces. The use of pulsed field evaporation should be adopted in these cases to avoid this problem. The shape of the specimen was found to change between DC and pulsed field evaporated conditions.
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