Abstract

Tungsten (W) is the prime candidate for the plasma facing material in present and future fusion devices. When exposed to a plasma containing He ions, W can exhibit creation of sub-surface nano-bubbles leading to formation of nano-tendrils called fuzz. Formation of W fuzz was confirmed by many laboratory experiments including He loading in linear plasma devices. There is, however, limited experience related to the parameter space for fuzz formation and re-erosion in a tokamak environment. For this reason, a dedicated experiment was carried out in ASDEX Upgrade (AUG) during its 2022 He campaign to study the evolution of fuzz-like W structures.Twelve tungsten samples were mechanically polished to a mirror-like surface finish. Six of them were subsequently exposed to a He plasma in the PSI-2 linear device in order to establish a fuzz layer with a thickness of 600 – 800 nm. Before exposure in AUG, all samples were pre-characterized by Focused Ion Beam (FIB) cross-sectioning. In total 48 FIB cross-sections with line markings for quantification of local erosion, deposition and fuzz formation were prepared – 4 on each sample. The samples were placed in two parallel poloidal rows spanning a range of 20 cm around the outer strike line position (OSP). They were subsequently exposed in AUG to a series of 14 consecutive discharges, 8 in H-mode and 6 in L-mode.Detailed analysis by means of electron microscopy revealed on the samples regions of erosion, deposition and fuzz formation. Below the H-mode OSP, homogeneous co-deposits containing W and O, with a thickness up to 400 nm, were found. In the close vicinity of the H-mode OSP, significant erosion of pre-exposure PSI-2 fuzz was observed. The erosion reached up to 100 – 250 nm, depending on the location. In addition, the initially polished samples did not show any newly formed fuzz in that zone. Above the H-mode OSP, new fuzz was formed with a thickness of up to 1 μm. There was no Mo found in the newly formed fuzz. Pre-exposure PSI-2 fuzz was either removed or modified.

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