Abstract
Fe/Cu/Fe multilayer thin film was grown on Si (100) substrate by using magnetron sputtering technique at room temperature. Dynamic and static magnetisations of the film have been investigated using ferromagnetic resonance (FMR) and vibrating sample magnetometer (VSM) techniques in the temperature range of 10–300 K. From the room-temperature in-plane FMR measurements, a growth-induced uniaxial magnetic anisotropy was observed. Out-of-plane FMR measurements exhibited a large magnetic anisotropy due to a large saturation magnetisation of Fe. A computer code was written to simulate the experimental FMR data and to obtain the magnetic parameters of the Fe/Cu/Fe multilayer thin film. g value, effective magnetisation, uniaxial anisotropy field and perpendicular anisotropy constant from the fitting of the angular dependence of the resonance field at both the in-plane and out-of plane geometries were determined. The exchange bias effect was observed from the low-temperature VSM measurements. The saturation magnetisation and coercive field decrease with increasing temperature due to the increase of the thermal fluctuations.
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