Abstract
We report the growth and characterization of ferromagnetic iron/silver (Ag/Fe) multilayer structures on gallium arsenide (GaAs) (100) substrates by molecular beam epitaxy. The samples have been characterized by x-ray diffraction and ferromagnetic resonance (FMR) techniques. X-ray read-camera studies have demonstrated the epitaxial nature of crystalline Fe film grown on GaAs substrate, while x-ray rocking curve measurements reveal a narrow linewidth of only 0.3°. On the FMR technique, we focused specifically on the information contained in FMR linewidth ΔH(f ). Experimental results on ultrathin Fe/Ag films have been obtained with sufficient resolution to measure the linewidth broadening due to intrinsic damping. FMR linewidth is resolved to vary between 0.5 and 1.1 GHz in a frequency range of 20 GHz. Frequency-dependent FMR linewidth ΔHpp(ω) shows a typical linear dependence with a zero frequency offset ΔH(0) of almost zero value, indicating a near-perfect crystalline quality of the deposited magnetic film. The Gilbert damping parameter G is extracted to be 1.45×108 s−1 from the slope of the curve.
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