Abstract
Static and dynamic domain behavior of ferroelectric fluoride BaMgF4 single crystal was investigated using high-resolution piezoresponse force microscopy. High domain wall anisotropy was found in the as-grown BaMgF4 crystal. Antiparallel domain wall strain phenomena due to defects across the domain boundary were directly observed. The lateral domain growth in the inhomogeneous AFM tip field revealed the activation mechanism of the domain wall motion.
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