Abstract

We report the time-resolved femtosecond evolution of the K-shell X-ray emission spectra of iron during high intensity illumination of X-rays in a micron-sized focused hard X-ray free electron laser (XFEL) beam. Detailed pulse length dependent measurements revealed that rapid spectral energy shift and broadening started within the first 10 fs of the X-ray illumination at intensity levels between 1017 and 1018 W cm-2. We attribute these spectral changes to the rapid evolution of high-density photoelectron mediated secondary collisional ionization processes upon the absorption of the incident XFEL radiation. These fast electronic processes, occurring at timescales well within the typical XFEL pulse durations (i.e., tens of fs), set the boundary conditions of the pulse intensity and sample parameters where the widely-accepted ‘probe-before-destroy’ measurement strategy can be adopted for electronic-structure related XFEL experiments.

Highlights

  • We report the time-resolved femtosecond evolution of the K-shell X-ray emission spectra of iron during high intensity illumination of X-rays in a micron-sized focused hard X-ray free electron laser (XFEL) beam

  • In this letter we report a systematic time-dependent study of the effects of high XFEL pulse intensity on the electronic structure of Fe compounds at various metal concentration probed by X-ray emission spectroscopy (XES)

  • If rearrangement of the electronic structure occurs to a significant fraction of atoms being probed during the duration of an XFEL pulse, the XES signal from the thereby modified atoms may contribute to the observed XES signal

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Summary

Introduction

We report the time-resolved femtosecond evolution of the K-shell X-ray emission spectra of iron during high intensity illumination of X-rays in a micron-sized focused hard X-ray free electron laser (XFEL) beam. In this letter we report a systematic time-dependent study of the effects of high XFEL pulse intensity on the electronic structure of Fe compounds at various metal concentration probed by X-ray emission spectroscopy (XES).

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