Fault modelling and simulation for the test of integrated analog and mixed-signal circuits

Abstract

This chapter describes test strategies, including a concise introduction to DSP testing, for analog and mixed-signal circuits. The main emphasis will be on integrated circuits. Although design-for-testability and design-for diagnosibility are only briefly reviewed, two self-test schemes for mixed-signal ICs are presented in more detail describing the necessary components along with implementations for the on-chip generation of test stimuli . Some prerequisites for automatic fault simulation of analog circuits are dealt with. Fault models for analog circuits are discussed and the local layout realistic faults mapping scheme which allows more realistic fault models to be obtained prior to the final layout is introduced. Appropriate simulation fault models are discussed along with a brief description of the automatic fault simulation tool AnaFAULT and the fault extraction tool LIFT.