Abstract
Based on possible defects on the layout of a practical non-ideal switch, fault model and test generation of current copiers, basic building block of switched-current circuits, are presented in this study, where we consider two types of switches, current switches and voltage switches, which have been commonly used in both switched-current circuits and switched-capacitor circuits. Both catastrophic and parametric faults of transistors used as switches are considered. Test sequences are proposed to achieve full testability of both current copiers and switched-current circuits. © 1998 John Wiley & Sons, Ltd.
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