Abstract
The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.
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