Abstract

We present a novel fast simulation approach to simulate the influence of refractive freeform microstructures on a wave field. The FRISP (Finite Refractive Index Selective Propagation) method combines the Rayleigh-Sommerfeld diffraction integral with a thin element approximation and provides a comprehensive framework for understanding the optical properties of these microstructures. The main advantage of this method is its reduced complexity, which leads to a remarkable reduction in computation time by more than two orders of magnitude compared to finite-difference time-domain (FDTD) methods. This efficiency facilitates the iterative optimization of refractive microstructures and thus represents a practical tool to improve this type of microstructures. The verification of the FRISP method is realized by comparing the focal position and spot size of refractive microstructures. For this purpose, we compare FDTD, Mie theory and experimental data on microspheres with the predictions of FRISP. This comparison demonstrates the robustness and reliability of the approach, emphasizes its validity and demonstrates it as a valuable tool for the design and analysis of microstructures.

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