Abstract
We propose a compact nearfield scheme for fast and broadband dielectric characterization in the microwave region. An open-type circular probe operated in the high-purity TE01 mode was developed, showing a strongly confined fringing field at the open end. This fringing field directly probed the freestanding sheet sample, and the overall reflection was measured. Without sample-loading processes, both of the system assembling time and the risk of sample damage can be significantly reduced. In addition, the nearfield measurement substantially simplifies the calibration and the retrieval theory, facilitating the development of easy-to-integrate and easy-to-calibrate dielectric characterization technique. The dielectric properties of more than ten polymers were characterized from 30 GHz to 40 GHz. We believe that this work fulfills the requirement of the fast diagnostic in the industrial manufactures and also provides valuable high-frequency dielectric information for the designs of 5G devices.
Highlights
With the advent of the 5th generation mobile networks (5G), numerous high-frequency circuits, such as power amplifiers [1,2], flexible antennas [3], and low-pass filters [4], are required for connecting billions of mobile devices and sharing a massive amount of data
We propose an open-ended circular-waveguide probe for fast and broadband dielectric characterization
We developed a semi-analytical model with a reliable single-mode approximation to simplify the dielectric retrieval process
Summary
With the advent of the 5th generation mobile networks (5G), numerous high-frequency circuits, such as power amplifiers [1,2], flexible antennas [3], and low-pass filters [4], are required for connecting billions of mobile devices and sharing a massive amount of data. It is essential to investigate the broadband dielectric properties of the circuit-board materials. By doping dielectric/magnetic nanoparticles into polymer matrices, the electromagnetic properties of the composites can be precisely controlled, realizing many terahertz (THz) and optical devices such as multilayer anti-reflection coatings [9], and all-dielectric waveguides [10]. To understand the electric functionality of the nanocomposites, fast and broadband dielectric characterization techniques at the microwave to the terahertz regimes are required. Various methods have been developed to meet this goal from 1 GHz to 1 THz [11,12,13,14,15,16,17,18,19,20]
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