Fast identification of short, linear perfectly conducting cracks in a bistatic measurement configuration

Abstract

In this study, we propose a sampling-type algorithm for a real-time identification of a set of short, linear perfectly conducting cracks in a two-dimensional bistatic measurement configuration. The indicator function is defined based on the asymptotic formula of the far-field pattern of the scattered field due to cracks. To clarify the applicability of the proposed algorithm, we investigate the mathematical structure of the indicator function using the Jacobi–Anger expansion formula. In particular, we derive an asymptotic formula for the indicator function in terms of the Bessel functions of the first kind and the parameters that depend on the bistatic measurement configuration. This asymptotic structure reveals intrinsic properties of the indicator function. We validate the theoretical results via various simulation results with synthetic and experimental data.