Abstract
We experimentally investigate the possible correlation between high hole-trap concentrations in wide-bandgap semiconductors and delayed temporal response of high-flux x-ray detector devices to changing photon fluxes. We show that fast photo-current response can be achieved with (1) CdZnTe detectors with high hole mobility-lifetime products, (2) temperature increased detrapping, and (3) constant below-bandgap energy light illumination that modifies the dark defect occupation towards a steady-state with a reduced concentration of active hole traps. This way, the detector signal stabilizes immediately upon flux onset, independent of details of the semiconductor's point defect structure. Quasi-instantaneous response stabilization (<; 3 ms) to x-ray flux changes > 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">7</sup> photons mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> s <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> is demonstrated.
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