Fast deterministic algorithm for EEE components classification

Abstract

Authors consider the problem of automatic classification of the electronic, electrical and electromechanical (EEE) components based on results of the test control. Electronic components of the same type used in a high- quality unit must be produced as a single production batch from a single batch of the raw materials. Data of the test control are used for splitting a shipped lot of the components into several classes representing the production batches. Methods such as k-means++ clustering or evolutionary algorithms combine local search and random search heuristics. The proposed fast algorithm returns a unique result for each data set. The result is comparatively precise. If the data processing is performed by the customer of the EEE components, this feature of the algorithm allows easy checking of the results by a producer or supplier.