Abstract
In the wavenumber region 3–400 cm −1 reflectivity measurements of high quality single crystal n-PbTe epitaxial films on NaCl substrates at T = 5, 77 and 300 K have been performed. From the analysis of the data a detailed information on the variation of the optical constants and particularly of TO phonon softening with decreasing lattice temperature is obtained for samples with n ≈ 0.3−3.0 × 10 17 cm −3. In addition the frequencydependence of the carrier collision time was investigated.
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