Abstract
ABSTRACTFar-infrared and terahertz spectroscopy of ferroelectric soft and central modes in thin films on substrates is reviewed. In addition to classical displacive proper ferroelectrics, also incipient and relaxor ferroelectrics and multiferroics are discussed. Special attention is paid to differences between the soft-mode behavior in thin films and bulk materials (ceramics and single crystals) and their influence on the low-frequency permittivity. Particularly the effects of the thin film strains and depolarizing electric fields of the probing waves on the grain boundaries are emphasized. The soft-mode spectroscopy is shown to be a very sensitive tool to reveal the thin film quality.
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