Abstract
AbstractA study of the main failure mechanisms in vacuum vapor‐deposited organic light‐emitting diodes (LED's) is presented. Three degradation modes were identified for a prototype bilayer ITO/TPD/Alq3/Mg/Ag device: a) formation and growth of black non‐emissive spots, b) abrupt ceasing of light emission associated with catastrophic failures caused by electrical shorts, and c) long term wearout associated with the decrease of quantum efficiency and luminance along with an increase in voltage, while the device is stressed under constant current.
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