Abstract
AbstractA study of the main failure mechanisms in vacuum vapor‐deposited organic light‐emitting diodes (LED's) is presented. Three degradation modes were identified for a prototype bilayer ITO/TPD/Alq3/Mg/Ag device: a) formation and growth of black non‐emissive spots, b) abrupt ceasing of light emission associated with catastrophic failures caused by electrical shorts, and c) long term wearout associated with the decrease of quantum efficiency and luminance along with an increase in voltage, while the device is stressed under constant current.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.