Abstract
This paper has studied the video processors for Flat Panel Display (FPD) which is defined as No Fault Found (NFF) among field failures. NFF phenomenon of video processor was the initial feature of field failure and showed Composite Video Broadcast Signal (CVBS) noise but it worked properly after some hours. NFF phenomenon has been a rising issue in the field of electronic device and the system recently. Highly Accelerated Life Testing (HALT) method has been used to reproduce field failure symptom. Modulated exciting technique has been applied as stress profile. Through the above, it was possible to reproduce the symptom which is the same as the field failure. Fault isolation and the defect was detected through the Advanced failure analysis method such as backside polishing, PEM, OBIRCH, and SEM. And it explains the defect and suggests the stress factor which can cause the defect.
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