Abstract
A surface-stabilized ferroelectric liquid crystal display (SSFLCD) fabricated using a developed polyimide (PI) alignment film (RN1199, Nissan chem. Ind.) demonstrates an excellent bistable memory capability with high contrast ratio owing to zigzag defect free. In order to clarify why PI-RN1199 film is so useful for fabricating defect-free SSFLCD, we have characerized PI-RN1199 film in comparison with other conventional PI films by observing the surface morphologies of rubbed PI films with an atomic force microscope (AFM). From the results of characterization of PI films, it is concluded that the formation of C2-uniform structure may be attributed to the smoothness of the surface of PI-RN1199 with a small pretilt angle.
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