Abstract
We present in this paper a method for characterizing the magnetic properties of magnetic force microscopy (MFM) tips. Well-defined magnetic nanostructures have been realized by depositing magnetic layers onto pre-patterned silicon substrates. Electron beam lithography, reactive ion etching and (Co/Pt) multilayers were used to prepare magnetic lines arrays. Atomic force microscopy has been used to characterize the topography. (Co/Pt) multilayers exhibit perpendicular magnetic anisotropy and both macroscopic and local magnetic properties have been determined with magneto-optical Kerr effect, SQUID, extraordinary Hall effect and MFM measurements. By using the point-dipole approximation, we show that such samples can be used to calibrate magnetic tips in order to perform quantitative measurements with MFM.
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