Abstract
The CuInGeSe4 thin film was deposited onto n-type single crystal silicon wafers by the electron beam deposition technique. The Au/CuInGeSe4/n-Si/Al heterojunction device has been fabricated. The structure of the CuInGeSe4 thin film was characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), and energy dispersive X-ray analysis (EDX). The dark current–voltage characteristics of the Au/CuInGeSe4/n-Si/Al heterojunction diode have been studied at a temperature range of 303–383 K. Also, the photovoltaic properties were examined at different illumination intensities. The capacitance–voltage characteristics of the CuInGeSe4/n-Si heterojunction were studied at different temperatures in the dark.
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