Abstract
The SrS: Ce3+ thin film active phosphor layer of different thickness based alternating current thin-film electroluminescent (ACTFEL) devices are fabricated by electron beam evaporation deposition (EBED) method. The morphology and chemical composition of the deposited films are investigated by field emission scanning electron microscopy (FESEM). The optical transmittance in visible range for the optimum film and optical band gap of SrS: Ce3+ film is described on the basis of Ce3+ doping concentration.
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