Abstract
This article reports successful fabrication and characterization of vacuum microelectronic OR gate logic using nanodiamond lateral diode structures. Two identical sets of four nanodiamond lateral diodes with different numbers of emitters, viz., 125, 325, 2340 and 9360, and with equal anode–cathode spacing of ~3.5-μm were fabricated on silicon-on-insulator (SOI) wafers. First the fabricated lateral emitters were characterized for emission current scaling to examine the scaling effect of different structures with respect to the forward emission current. Then, two identical diodes were connected in a circuit using diode–resister logic to realize the logic OR function with a square wave as an input signal. The current scaling behavior, demonstrating 1μA current at 18, 15, 7 and 2.2V for 125-, 325-, 2340- and 9360-fingered emitter structures respectively, directly affects the logic OR response. These nanodiamond vacuum logic gates are promising for application in harsh environments.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
