Abstract
In the development for the coated conductors, the trifluoroacetates-metal organic deposition (TFA-MOD) process using the multi-coating method was applied to form thicker YBa 2Cu 3O y (YBCO) films on the CeO 2 buffered IBAD(Zr 2Gd 2O 7)/Hastelloy tape. As a result, in the 5 times coated film with 1.38 μm in thickness, the J c and I c values achieved to be 1.5 MA/cm 2 and 210 A, respectively. Then, we fabricated a 1 m long YBCO tape by the continuous reel-to-reel system. As a result, we confirmed the tape to be homogeneous by XRD analysis. Additionally, we report the theoretical analysis of YBCO growth during post-annealing in the TFA-MOD process considering both the diffusion in the gas boundary layer and the growth kinetics at the precursor/YBCO interface. This model reveals a basic idea of the growth mechanism to define the steady state growth rate, and could explain the experimental results. In addition, it predicts that the growth rate could be estimated from the partial pressure of the water vapor of the inlet gas.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
