Abstract
In this paper we report the thin-film in-plane fabrication and the structural characterization of artificially engineered grain boundaries obtained by partly interposing an MgO seed layer between the SrTiO3 (STO) substrate and the CeO2 buffer layer. X-ray pole figures show that films grown onto the seed layer are slightly disordered with respect to the remaining part of the sample. The junctions, realized by patterning the grain boundary occurring in the overhanging YBCO film show Josephson current modulation in a large temperature range with an IcRn value of about 230 μV at 9 K, the Rn value being constant over the whole superconducting region. Under microwave irradiation, the I–V characteristics display several Shapiro steps while in accordance with the resistively shunted junction (RSJ) behavior, the step heights have the typical current-biased junction dependence.
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