Abstract
Fabrication and characterisation of YBCO step-edge Josephson junction arrays in a series configuration are reported. The junction arrays were fabricated using CSIRO YBCO step-edge junction technology, which, owing to the flexibility of locating the junctions anywhere on the chip, makes it very attractive for implementation of multiple HTS devices and circuits. Arrays of 50 junctions in series were fabricated, and the DC current-voltage (I-V) characterisations were studied at temperatures ranging from 15 to 77 K; temperatures were obtained via either placing the samples in the vent gas of a liquid He cryostat or use of a commercial cryocooler. Eight fabricated and tested arrays, totalling 400 junctions, showed no electrically open or shorted junctions (i.e., a 100% yield of working Josephson junctions), demonstrating good fabrication reliability. Large junction normal resistances (several hundred Ωs) were obtained from the series junction arrays, making them suitable for a range of high-frequency applications. A study of the junction critical current spread within an array, magnetic field dependence of the critical current, and microwave responses of the arrays is also described.
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