Abstract
Type-II GaAsSb/InP double heterojunction bipolar transistors (DHBTs) with a novel InGaAsP ledge structure were studied utilizing a 2-D hydrodynamic physical device model for the first time. The proposed ultrathin InGaAsP ledge design provides a simple and effective approach to suppress the emitter size effect and enables nanoscale GaAsSb/InP DHBTs to further increase the operating frequencies and integration levels for submillimeter-wave applications.
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