Abstract
This article puts forward a technique for extracting the density of trap states (DOST) distribution based on the transient photo-voltage (TPV) measurement result. We prove that when the TPV result is linear, the DOST distribution is exponential type and vice versa. Compared to the approach based on the space charge limited current measurement, the method given in this paper has the advantage of requiring less calculation. The results obtained by our method provides a guidance for preparing less trap states solar cells.
Highlights
This article puts forward a technique for extracting the density of trap states ( DOST) distribution based on the transient photo-voltage (TPV) measurement result
DOST distribution based on the TPV result
This article presents a new technique for DOST distribution extraction based on the TPV measurement result
Summary
This article puts forward a technique for extracting the density of trap states ( DOST) distribution based on the transient photo-voltage (TPV) measurement result. Wang et al.[46] proposed a transient photo-voltage (TPV) method for D OST distribution extraction. The DOST distribution extracted by their method is an exponential type distribution[46,47,48].
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