Abstract
We developed a method for extracting the height probability density of random surfaces by light scattering. Theoretical results show that height probability function is the Fourier transform of the central δ-peak in the light waves of angle-resolved light scattering. Experimentally, we measure the δ-peak intensities at a different angle of incidence in a simple setup. We then reconstruct the phase distributions of the δ-peak versus the perpendicular component of the wave vector from the intensities using the Gerchberg–Saxton inversion algorithm, and then extract the height probability density of the samples. Two different types of samples are measured to verify the validity of the method, and the results are compared with those obtained by atomic force microscopy.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
