Abstract
In contrast to the conventional Transient Plane Source (TPS) method, the Transient Plane Source Scanning (TPSS) technique allows for the direct determination of the specific heat capacity and requires the use of a specially designed sample holder for accurate measurements. While this method correctly determines the specific heat capacity of samples with moderate and high thermal conductivity, it tends to underestimate the values for those with low thermal conductivity. This paper demonstrates that the underestimated specific heat capacity results from heat loss during the measurement process. To precisely quantify the heat loss, a numerical model based on the finite element method was developed, with key material properties tuned based on measurement data. This model can closely describe the curve of measured thermal response, thereby enabling the precise determination of the specific heat capacity. Consequently, this study introduces a novel approach that incorporates numerical simulation to enhance TPSS measurements of poorly conducting samples, providing a reliable alternative for determining the specific heat capacity.
Published Version
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