Abstract
We show that it is possible to extend the lower limit of the spectral range of Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectroscopy on Si surfaces from 1500 to ∼850 cm−1 using a Ge ATR prism coated with a thin epitaxial layer of Si, making accessible the especially important fingerprint region of organic molecules. The utility of the ATR prism is demonstrated by collecting FTIR spectra of several surface terminations of Si (H, oxide, 3-aminopropyltrimethoxysilane, and DNA) that contain peaks in the newly accessible spectral region.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
