Extended reverse Monte Carlo method for extracting optical constants of thin Ni film from reflection electron energy-loss spectroscopy

Abstract

SynopsisAn extended reverse Monte Carlo (RMC) method for obtaining optical constants of ultrathin films and solids is presented. Our results show that this method works very well in extracting some exquisite information from experimentally measured reflection electron energy loss spectroscopy (REELS) spectra. The energy loss function (ELF) of 100 nm nickel film in a relatively larger energy loss range of 0-200 eV has been obtained, which agrees well with other computational data. Employing this ELF, individual contributions to REELS intensity due to surface and bulk plasmon excitations are quantitatively separated for further study.