Abstract
Abstract Weal-beam high-resolution micrographs were taken of dislocations in germanium which had been generated by plastic deformation at 520°C and τ=2 kp/mm2. All dislocations examined were found to be at least partially dissociated with a partial dislocation separation of (54 ± 11) A for edge type observed double contrast of the dislocations cannot be due to dipoles.
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