Abstract
Explosive crystallization of about 2-μm thick amorphous CdTe films prepared by rf-sputtering in an Ar-N2 ambient has been observed. The transformation can be initiated with or without external thermal or mechanical impulses depending on the oxygen content of the films. The crystallization is accompanied by a light flash. X-ray diffraction, Auger analysis, and resistivity measurements were made on these films to arrive at a qualitative model to explain the observations.
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