Abstract
In our study, Pr0.01Zn0.97O (PZ) and Pr0.01Bi0.01Zn0.97O (PBZ) were synthesized by sol-gel method. The correlation among their structural and dielectric properties was investigated in details. We used the X-ray diffraction (XRD) along with Rietveld refinement to confirm the hexagonal wurtzite structure with P63mc space group and the existence of a secondary phase attributed to the praseodymium oxide (Pr6O11) in all samples. We have also used the impedance spectroscopy to find the impacts of temperature and frequency on dielectric properties of our samples. The dielectric properties revealed that the Pr0.01Zn0.97O sample shows a low tangent loss and a high conductivity compared with Bi doped Pr0.01Zn0.97O sample, which demonstrates the potential application of the Pr0.01Zn0.97O in microwave semiconductor devices.
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