Abstract
AbstractRecently, many breakthroughs have been made in graphene research, allowing scientists to explore and understand the material world from a two‐dimensional (2D) perspective. The interface issue of graphene is the most important, because all of its atoms are exposed to the interface for this atomically thin material. The 2D nature necessitates a sensitive and non‐destructive interface probe to detect the structure and properties. Synchrotron radiation (SR) characterization techniques, with the ultra‐high resolution and extremely wide energy range, have been utilized with increasing frequency to explore the challenging interface sciences. In this review, these interface characterization techniques based on SR and how they monitor the structure evolution of graphene in different interfaces such as graphene–substrate and graphene–graphene interface are first introduced. Graphene's layer number, interlayer spacing, and stacking order are governed by these interfaces, determining the final properties. Then, the property detection and modulation in different interfaces of graphene are also discussed. Finally, the current challenges and outlook on the future development for SR techniques to characterize graphene interface are presented.
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