Abstract
Conductance variations of resistive random-access memory (RRAM) are significant challenges that hinder the accurate inference of neural network (NN) hardware. In this study, we exploit the read noise of the RRAM as an active computational enabler for implementing probabilistic NN. As electrical characteristics of RRAM are directly related to the properties of conductive filament (CF), we statistically explore read current of TiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</sub> -based RRAM with different forming conditions and explain the results by linking the CF model. In addition, an array mapping scheme to transfer weights to one transistor-one RRAM (1T1R) array is experimentally demonstrated. Through NN simulations, we verify that the probabilistic NN shows promising results on nonlinear classification problem avoiding overconfidence compared with deterministic NN.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.