Exploiting Process Variation for Read Performance Improvement on LDPC Based Flash Memory Storage Systems

Abstract

With the development of bit density and technology scaling, the process variation (PV) has become much severe on NAND flash memory. As PV presents reliability among flash blocks, which causes read performance variation to read data on different blocks. This paper proposes to improve read performance of LDPC based flash memory by exploiting the reliability characteristics of PV. First, a block grouping approach is proposed to classify the flash blocks based on their reliability. Then, a read data placement scheme is proposed, which is designed to place read-hot data on flash blocks with high reliability and move read-cold data to blocks with low reliability. Experiment results show that, with negligible overhead, the proposed scheme is able to significantly improve the read performance.