Explicit drain current model of junctionless double-gate field-effect transistors

Abstract

This paper presents an explicit drain current model for the junctionless double-gate metal–oxide–semiconductor field-effect transistor. Analytical relationships for the channel charge densities and for the drain current are derived as explicit functions of applied terminal voltages and structural parameters. The model is validated with 2D numerical simulations for a large range of channel thicknesses and is found to be very accurate for doping densities exceeding 1018cm−3, which are actually used for such devices.