Abstract
To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temperature changes. The main reasons for these degradations are discussed and analyzed in this paper. The research performed in the study provides another angle to handle the practical working environments rather than the extreme cases as the reliability study.
Highlights
Integrated transceiver solutions realized by standard CMOS processes are being widely applied in radio systems and applications such as wireless/mobile communications,1–4 radar systems,5–7 satellite communications,8,9 and navigation systems.10 some application systems must be used in outdoor environments, even in hazardous/extreme environments
The class-A Power Amplifiers (PAs) used in our experiment was fabricated in the 0.18 μm CMOS 1P6M process operating at 0.1–1.2 GHz and is shown in Fig. 2.24 The chip area is only 0.414 mm2
The performance degradations of the PA at different temperatures have been investigated experimentally. This is different from getting the life of a PA due to the temperature, we are focusing on the temperature effects on the key specification degradations
Summary
Integrated transceiver solutions realized by standard CMOS processes are being widely applied in radio systems and applications such as wireless/mobile communications, radar systems, satellite communications, and navigation systems. some application systems must be used in outdoor environments (for instance, the base stations for mobile communications, mobile phones, and radar stations), even in hazardous/extreme environments. Due to the failure of a specification to meet the user’s needs, such unavailability is the most urgent and quantitative knowledge that the user wants to know, given the knowledge of the PA’s lifetime. This is the critical hot issue that needs to be solved urgently in the current “usability” research (traditional “usability” research is mainly about the life of systems or electronic devices, which is the traditional reliability research). It is a newly emerging research field in the international arena..
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