Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP

Shunshun Zheng, Zhili Liu + Show 8 more

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https://doi.org/10.3390/electronics13112012

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Journal: Electronics	Publication Date: May 22, 2024
License type: cc-by

Abstract

Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP

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