Experimental Study of Locking Phenomena on Oscillating Rings Implemented in Logic Devices

Abstract

Oscillating rings are widely used in CMOS logic devices because they are easy to integrate, require low area and low power. Their main disadvantage is that they tend to lock to each other and/or to an external periodic signal. This locking phenomenon can render a system based on a freely running oscillator non-functional. A detailed study of the causes of the phenomenon and how to avoid it, is therefore of paramount importance. In this paper, we conduct a detailed examination of the locking phenomenon using the most commonly used rings: ring oscillators, transient effect ring oscillators, and self-timed rings. We then analyze the consequences of locking on different use cases based on oscillating rings and provide design recommendations to minimize its impact. Our results could help designers better anticipate locking phenomenon in their future designs. To ensure reproducibility of the results, the VHDL code of all the experiments is available and can be downloaded from a dedicated web page.