Abstract
This basic study conducted an X-ray fluorescence (XRF) analysis on pseudo-binary samples, which emphasis on the binary influence coefficient and correction for matrix effects. The Ti-V, V-Ti, Ti-Fe, Fe-Ti, V-Fe and Fe-V samples were confected and measured by XRF analysis using a Si-PIN detector. These coefficients were calculated using mathematical models proposed through the Lachance-Traill algorithm, which can be applied in practice via an efficient calibration procedure. For the content measurement, the maximum absolute error decreased from 5.92% to 0.27%, and the relative error decreased from 14.84% to 0.66% via fitting correction for matrix effects. This study describes and emphasizes the application of the binary influence coefficient and fitting correction method.
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