Abstract
Secondary electron emission yield, δ, was measured as a function of primary electron energy, EP, using an Auger electron microscope to obtain the δ(EP) curve of TiO2 for the first time. As a reference, the δ(EP) curve was also measured for Ti to verify the accuracy of this experiment. The construction of a specific sample holder was carried out for the precise measurement of secondary electron emission. The maximum secondary electron yield δm=1.2 at EP=260 eV for TiO2 whereas δm=0.9 at EP=280 eV for Ti.
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