Abstract

Isotropic field probes are used to characterize the electric field in radiated susceptibility testing of electronic systems. These probes are required to be periodically calibrated by the original equipment manufacturer, which is essential as per test requirements. Getting a probe calibration done is a time consuming process for an EMC laboratory. If the probe calibration is not done periodically, than the validity of test results are questionable. In this paper, we have demonstrated to use the ACD type D dot sensor in frequency domain in place of isotropic probes, in radiated susceptibility testing. The D dot sensors do not have active electronic circuitry and therefore are not required to be calibrated periodically.

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